- Title
- Defect recovery processes in Cr-B binary and Cr-Al-B MAB phases: structure-dependent radiation tolerance
- Creator
- Kim, Jun Young; Zhang, Hongliang; Su, Ranran; Xi, Jianqi; Wei, Shuguang; Richardson, Peter; Liu, Longfei; Kisi, Erich; Perepezko, John H.; Szlufarska, Izabela
- Relation
- Acta Materialia Vol. 235, no. 118099
- Publisher Link
- http://dx.doi.org/10.1016/j.actamat.2022.118099
- Publisher
- Elsevier
- Resource Type
- journal article
- Date
- 2022
- Description
- We have investigated the radiation tolerance of Cr-B binaries and Cr-Al-B ternary MAB phases using a combination of ab initio calculations and experiments. One key discovery is that Cr3AlB4 has excellent resistance to radiation-induced amorphization, and therefore it is a promising material for applications in extreme environments. We also demonstrate that both the type of B network and the presence of Al layer in the structure have important implications for defect kinetics. We find that the order of the tolerance to radiation-induced amorphization is, from high to low, CrB, Cr3AlB4, Cr3B4, Cr4AlB6, and Cr2AlB2 at 150 °C and 0.5 dpa, and Cr3AlB4, CrB, Cr3B4, Cr4AlB6, and Cr2AlB2 at 300 °C and 1.0 dpa. The results are explained in terms of defect properties determined from ab initio calculations.
- Subject
- aluminum compounds; amorphization; chromium compounds; defects
- Identifier
- http://hdl.handle.net/1959.13/1494901
- Identifier
- uon:53915
- Identifier
- ISSN:1359-6454
- Language
- eng
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